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SBExpress-RM4

PCIe® Gen4 NVMe SBExpress Test System

 

SBExpress-RM4 (Rackmount Gen4) Test System

The SANBlaze SBExpress-RM4 is a complete turnkey PCIe® Gen4 NVMe SSD Drive validation test system. The SBExpress-RM4 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles.  

The ability to drive Gen4 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform.
 
Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.

The SANBlaze SBExpress-RM hardware provides a rackmount chasis with sixteen dual or single port front-accessible drives. The hardware can be easily daisy chained for maximum scaleability.

S O F T W A R E  F E A T U R E S

  • Test coverage for all aspects of the Version 1.3 IOL NVMe specification
     

  • NVMe-MI (Management Interface) testing over SMBus
     

  • Conformance Test Suite 7.0 with Dual Port drive support SGL, SR-IOV, full namespace control and reservations
     

  • Drive multiple ports of traffic simultaneously

     

  • Read / write / compare testing
     

  • Error injection
     

  • Custom command builder
     

  • Drive and test single or multiple NVMe target devices
     

  • Send specific or custom op codes in an easy to use scriptable format

S Y S T E M  F E A T U R E S

  • ​Sixteen drives, all front accessible
     

  • All sixteen drives can be single or dual port
     

  • Risers are field replaceable
     

  • Ability to power on/off drives
     

  • Measure voltage and power at each drive
     

  • Height:  3.5"  | Width w/ Ears: 19"  | Width without Ears: 17 1/8"
     

  • Depth w/ Handles: 22 3/4"  | Depth without Handles: 21 3/4"
     

  • AC Input 100-127 Vac/200-240Vac
     

  • Max 14A at 100V
     

  • Excellent thermal design with  unobstructed air flow 
 
  • Six fans, all independently speed controlled 
 
  • Eight temperature monitor points
 
  • Thermal Characteristics: 
    • Temperature: -5C to 70C 
    • Humidity: 95% RH Non-condensing
 
  • Voltage margining +/- 15% 
 
  • Hot plug, slot power, and drive presence under software control

All information is subject to change. Configurations rely on host system BIOS support and may be restricted by the host. Contact SANBlaze for additional information.

H A R D W A R E  C O M P O N E N T S

PCIe Adapter

PCIe Adapter and Cable

VirtuaLUN Software

RM riser- black 0 2.jpg

RM4 Riser

Download our Data Sheet on the SBExpress-RM4

General Features
 

  • High bandwidth NVMe 1.3 testing (24GB/sec)

  • NVMe-MI (Management Interface) testing support

  • Full hot-plug support

  • Voltage margining

  • Power monitoring at each drive

  • Automated stress testing for validation

  • Software integration for automation test environments REST/XML API and CLI test infrastructure

  • Performance over time, power over time

  • Latency testing

  • UNH conformance test support

  • Dual and Single Port SSD support

  • m.2 SSD adapter available

  • I2C connection to Management Interface (MI)

SBExpress VirtuaLUN NVMe Software

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  • The VLUN NVMe software provides full control and programmability of parameters, providing unique storage test conditions for NVMe drive testing, development and conformance testing. VLUN software includes:

  • Test coverage for all aspects of the 1.3 Version NVMe specification

  • UNH Conformance Test Suite 7.0 with Dual Port drive support

  • SGL, SR-IOV, full namespace control and reservations

  • Drive multiple ports of traffic simultaneously

  • Send specific or custom op codes in an easy to use scriptable format

  • Read/write/compare testing

  • Error injection

  • Custom command builder

  • Drive and test single or multiple NVMe target devices

Key Applications
 

  • Quarch™ integration, which allows signal “glitching,” hot plug/surprise removal*

  • Simultaneous signal integrity test control with data verification

  • Extensive NVMe command control including firmware download, format, namespace management, T10 DIF

  • Generic IO for all NVMe low level and custom commands

  • Performance testing

  • Error handling

  • Multi port failover testing

  • Full validation test capability beyond “UNH conformance” with a fully customizable solution to match “end to end” departmental test requirements from engineering development to validation to QA to manufacturing floor

    *coming soon

NVMe Test Platform Features
 

  • Supports 4-lane (Single) and 2×2-lane (Dual) PCIe devices.

  • Supports a total of 8 DUT’s dual path or 16 DUT’s single path

  • Internal power source – 110V/240V AC, 50-60Hz, 8.5A.

  • NVMe connector savers (interposer boards)

  • Hot swappable devices under test

  • Status and power indicators

  • Power margining

  • Power measurements and insertion count

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